Robust defect image synthesis using null embedding optimization for industrial applications
2026_전 · 2026년 6월 1일
Hyunwook Jo, Jun Hyung Park and In Kyu Park, Expert Systems with Applications, 2026 DOI
- ‹ 이전 글FAST‑DIPS: adjoint‑free analytic steps and hard‑constrained likelihood correction for diffusion‑prior inverse problems
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